VeEX adds native OSFP transceiver support to RXT-6400 400GE handheld test set
December 6, 2019
VeEX, a global leader in innovative test and measurement solutions for next-generation networks, formally announced today the availability of its second generation RXT-6400 Advanced 400G test set, with native PAM4 support for OSFP and QSFP-DD transceivers.
The new RXT-6400 module, shipping to key customers since October, is based on the latest generation of flexible, state-of-the-art 58G PAM4-based FPGA technology. This native PAM4-based design enables best-in-class signal integrity (no adapters required) and allows the test set to continue adapting to evolving 400GE technology. In addition, it addresses common 100GE and below applications, keeping true to the proven forward-looking spirit of VeEX’s RXT-1200 test platform.
“Back in 2018, VeEX pioneered the 400G PAM4 lab-to-field transition with the introduction of the RXT-6400, the first and only handheld tester with native QSFP-DD support. The RXT-6400 opened many doors for us and allowed us to have open conversations with NEMs, transceiver manufacturers, datacenters, and service providers. This allowed us to understand PAM4’s state-of-the-art technology, foreseeing the challenges and technology trends,” said Ildefonso M. Polo, VP of Product Marketing for VeEX. “We listened to all of the suggestions and experiences from R&D, SVT, FAEs and lab evaluation teams and decided to build an improved second generation RXT-6400 test set to address them and offer a better solution for current and future requirements. For example, adding native support for OSFP makes it more flexible, future-proof and helps us address wider markets and applications.”
Key improvements added to the 2nd generation RXT-6400:
- OSFP cage (in addition to QSFP-DD)
- Dual ports for 100G and below (future-proofing)
- OSFP and QSFP-DD case temperature monitor (in addition to transceivers’ internal sensors)
- Transceiver power consumption measurement (in addition to variable voltage supply)
- Eye clock reference and recovered clock outputs
- Improved interoperability
- Improved cooling
Field test and measurement equipment require flexibility, practicality and portability to address a wide range of testing requirements. The new RXT-6400 module fulfills this promise by supporting multiple PAM4 and NRZ data rates from 1GE to 400GE, with OSFP, QSFP-DD, QSFP56, QSFP28, QSFP+, SFP28, SFP+, and SFP and 1000BASE-T (SFP) transceivers.
The RXT-6400 400GE test module is still the industry’s most compact and powerful handheld test solution currently available to assist with 400GE commercial deployment. A true handheld with battery operation, the RXT reduces testing time at large data centers and aggregation nodes. This saves time and increases efficiency and ease-of-use for installation and maintenance crews working on large equipment rooms, data center clusters or customers’ premises. In addition, mobility and reduced size and weight are also important to NEMs and transceiver vendors traveling around the globe promoting their new solutions, performing demonstrations, assisting interop tests, benchmarking, troubleshooting, evaluations and supporting their customers.
With the new RXT-6400, along with the successful deployment of the MPA MPM-400AR dual-port 400GE rack mount test solution, VeEX is leading the way in 400G test and measurement.