VeEX announces issuance of US Patent covering OFDM Subcarrier Scan measurement
March 12, 2021
VeEX, a global player in innovative test and measurement solutions for next-generation networks, has announced that the United States Patent and Trademark Office has recently issued U.S. Patent No. 10,756,778, ‘Systems and Methods for Subcarrier Scan.’
Subcarrier Scan is a core piece of VeEX’s industry leading portfolio of DOCSIS 3.1 OFDM field analyzers, including its CX310, CX380C, CX380s-D3.1 and AT2500-3G models. One of the key benefits of Subcarrier Scan is its powerful, in-depth graphical depiction of OFDM subcarrier data, including Power, MER, and Noise, which enables cable operators to identify hidden interference residing in the same spectrum as OFDM channels.
“Over the past few years of DOCSIS 3.1 deployment, our key MSO customers have benefited from our easy-to-use OFDM Analysis measurements,” said Steve Kim, Director of Product Marketing at VeEX. “Our patented Subcarrier Scan measurement has proven to be effective, helping to verify solid OFDM signal transmission, as well as resolving mystifying impairment issues.”